LIVERMORE, Calif., May 29, 2020 (GLOBE NEWSWIRE) -- FormFactor, Inc. (FORM), a leading semiconductor test and measurement supplier, today announced the release of the SmartMatrix 3000XP probe card, ...
T5801 Ultra-High-Speed DRAM Test System · GlobeNewswire Inc. TOKYO, Feb. 12, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced ...
DRAM technology has reached a juncture requiring significant revisions in test approaches—unless, of course, it hasn't. ATE powerhouses Advantest and Agilent Technologies have staked out significantly ...
Agilent Technologies has entered the DRAM final-test market with the 93000 High-Speed Memory (HSM) Series, which targets devices used in memory-hungry computers and consumer-electronics products such ...
The Neumonda Octopus Tester consists of six individual tiles. Neumonda Group Logo The only tester that can test four different DRAM Technologies at full speed under real real-world signal and power ...
During a component test, about 2-3% of the DRAMs fail. If only the modules are tested, the fail rate is about ten times higher. Our Octopus tester increases the yield and quality of DRAM modules.” — ...
Rowhammer is proving to be a difficult DRAM issue to fix. While efforts continue to mitigate or eliminate the effect, no solid solution has yet made it to volume production. In addition, more ...
TOKYO, Feb. 12, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced the T5801 Ultra-High-Speed DRAM Test System. The cutting-edge ...
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