To achieve higher quality on multimillion gate designs and high-speed ASICs, manufacturers are relying on structured DFT (design-for-test) methodologies such as scan, at-speed test, scan compression, ...
At $399,000, the 93000 SoC (system-on-a-chip) DFT (design for test) series promises users a one-cent-per-second cost of test. As such, this version of the Agilent Technologies 93000 SoC platform would ...
New manufacturing test challenges are raised with SoC technology advances where both test quality and test costs are affected with a direct impact on current Design-For-Test (DFT) methodologies and ...
The Design-for-Test (DFT) methodology is a strong driving force in the cost-effective testing of large-volume commodity items with very short life cycles, like system-on-chip (SoC) devices. It will ...
Whether you are a DFT engineer or a SoC designer, connectivity validation will no doubt be a top priority when taking steps to guarantee the functionality and reliability of your device. SoC designs ...
The complexity with system-on-chip (SoC) design continues to grow, creating greater complexity of the corresponding design-for-test (DFT) logic required for manufacturing tests. Design teams are ...
The testing and verification of semiconductor chips was a prominent topic at this year’s European Test Systems (ETS) conference, especially in the area of Design-for-Test (DFT) tools and techniques.
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