Abstract: Memory Built-In Self-Test (BIST) is a common method to test embedded memories on a chip owing to its fast and low-cost testing. Its efficiency depends on the complexity and the fault ...
Abstract: The Kriging model has been widely used in regression-based surrogate-assisted evolutionary algorithms (SAEAs) for expensive multiobjective optimization by using one model to approximate one ...
Jan. 6 defendants, including those pardoned by President Trump last year, are holding a march Tuesday to commemorate the fifth anniversary of the Capitol attack. Former Proud Boys leader Enrique ...
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