Abstract: One-shot devices, such as automotive airbags, fire extinguishers and ammunitions, pose significant challenges in their reliability analysis due to their inherently unobservable lifespans.

For most of the industry’s history, the lever for semiconductor performance gains was process-node scaling. That is no longer the whole story. As one recent industry analysis put it, advanced ...

Abstract: This work presents a pioneering approach that utilizes plasma as a high-loss substrate. By designing a checkerboard metasurface on the dielectric-barrier discharge (DBD) plasma substrate, ...